Research Catalog

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  • EEEL ... technical accomplishments [microform] / Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology.

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • 1993-present

  • National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
    • 1995-present
    • 3 Items

    Available Online

    http://purl.access.gpo.gov/GPO/LPS1622
    FormatCall NumberItem Location
    Text C 13.37:103/ 2000Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 1999Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 1998Off-site

  • National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
    • 1995-present
    • 2 Items
    FormatCall NumberItem Location
    Text C 13.37:103 2000Off-site
    Request for On-site UseRequest Scan
    How do I pick up this item and when will it be ready?
    FormatCall NumberItem Location
    Text C 13.37:103 1998Off-site

  • National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

    • Text
    • Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
    • 1995-present
    • 5 Items

    Available Online

    http://purl.access.gpo.gov/GPO/LPS1622
    FormatCall NumberItem Location
    Text C 13.37:103/ 2000Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 1999Off-site
    FormatCall NumberItem Location
    Text C 13.37:103/ 1998Off-site

    View All 5 Items

  • Metrology for radio frequency technology [microform] : a bibliography of NIST publications.

    • Text
    • Boulder, CO : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
    • unknown-present

  • Program plan [microform] / Electronics and Electrical Engineering Laboratory.

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, Electronics and Electrical Engineering Laboratory
    • 1993-
    • 1 Resource

    Available Online

    http://purl.access.gpo.gov/GPO/LPS20014

  • Technical progress bulletin [microform] / Center for Electronics and Electrical Engineering.

    • Text
    • Gaithersburg, Md. : U.S. Dept. of Commerce, National Engineering Laboratory
    • 1982-present

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