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Displaying 1-50 of 567 results for keywords "WITH WAFERS"
Ṿaflim limon = Lemon wafers / Yehudah Gizbar.
- Text
- Rishon le-Tsiyon : Yediʻot aḥaronot : Sifre ḥemed, [2020]
- 2020
- 1 Item
Item details Format Call Number Item Location Text PJ5055.22.I98 V34 2020 Off-site Ṿafelim limon = Lemon wafers / Yehudah Gizbar.
- Text
- Rishon le-Tsiyon : Miśkal : Yediʻot aḥaronot : Sifre Ḥemed, [2020]
- 2020
- 1 Item
Item details Format Call Number Item Location Text PJ5055.22.I98 V34 2020 Off-site Ṿaflim limon = Lemon wafers / Yehudah Gizbar.
- Text
- Rishon le-Tsiyon : Yediʻot aḥaronot : Sifre ḥemed , [2020]
- 2020
- 1 Item
Item details Format Call Number Item Location Text PJ5055.22.I98 V34 2020 Off-site Wafer thin / by Elin Elgaard.
- Text
- Dunvegan, Ont., Canada : Cormorant Books, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text PR9199.3.E43 W333 1992 Off-site Pressed wafer [microform] / John Wieners.
- Text
- Buffalo, N.Y. : Gallery Upstairs Press, c1967.
- 1967
Wafer thin / by Elin Elgaard.
- Text
- Dunvegan, Ont., Canada : Cormorant Books, c1992.
- 1992
- 1 Item
Item details Format Call Number Item Location Text JFD 93-12669 Schwarzman Building M2 - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.
Phonographic wafers ...
- Text
- Bath [Eng.] I. Pitman [186-?]
- 186
- 1 Item
Item details Format Call Number Item Location Text *IDF (Phonographic Institution, Bath, Eng. Phonographic wafers) Offsite Pressed wafer / John Wieners.
- Text
- Buffalo, N.Y. : Gallery Upstairs Press, c1967.
- 1967
- 1 Item
Item details Format Call Number Item Location Text JAX B-2835 Schwarzman Building M2 - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.
Pressed wafer.
- Text
- Boston, MA : Pressed Wafer, 2000-
- 2000-present
- 13 Items
Item details Format Call Number Item Location Text JFL 01-522 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location Text JFL 01-522 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Item details Format Call Number Item Location Text JFL 01-522 no. 1 2000 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Fifth generation wafer architecture / Malcolm J. Shute.
- Text
- New York, N.Y. : Prentice Hall, 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text JSE 88-671 Offsite Wafer scale integration / edited by Earl E. Swartzlander, Jr.
- Text
- Boston : Kluwer Academic Publishers, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TK7874 .W33 1989 Off-site The manufacture of biscuits, cakes, and wafers, by J. Fritsch ... in collaboration with P. Grospierre ...adapted from the French by Charles M. Stern ...
- Text
- London, Sir I. Pitman & Sons, Ltd., 1932.
- 1932
- 1 Item
Item details Format Call Number Item Location Text VTI (Fritsch, J. Manufacture of biscuits, cakes, and wafers) Offsite Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).
- Text
- Berlin ; New York : Springer-Verlag, [2004], ©2004.
- 2004-2004
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .W27 2004 Off-site Fifth generation wafer architecture / Malcolm J. Shute.
- Text
- 1988
- 1 Item
Item details Format Call Number Item Location Text QA76.85.S58 1988 Off-site The technology of wafers and waffles. II, Recipes, product development and know-how / edited by Karl F. Tiefenbacher.
- Text
- London, United Kingdom ; San Diego, CA : Academic Press, [2019]
- 2019
- 1 Item
Item details Format Call Number Item Location Text JFE 19-4367 Schwarzman Building - Main Reading Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Noise temperature measurements on wafer / James. Randa.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1997.
- 1997
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo98704Pressed wafer / John Wieners.
- Text
- Buffalo, N.Y. : Gallery Upstairs Press, [1967], ©1967.
- 1967-1967
- 1 Item
Item details Format Call Number Item Location Text PS3573.I35 P7 Off-site Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).
- Text
- Berlin ; New York : Springer-Verlag, c2004.
- 2004
- 1 Item
Item details Format Call Number Item Location Text JSE 04-1202 Offsite Jeremy Wafer : artist's book / Lola Frost.
- Text
- Johannesburg, South Africa : David Krut Pub., 2001
- 1 Item
Item details Format Call Number Item Location Text MEMZ (Wafer) 05-2486 Schwarzman Building - Print Collection Room 308 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.
Noise temperature measurements on wafer [microform] / J. Randa.
- Text
- Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
- 1997
Semiconductor wafer bonding : science and technology / Q.-Y. Tong, U. Gösele.
- Text
- New York : John Wiley, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .T66 1999 Off-site Apparatus for edge etching of semiconductor wafers [microform] / Casajus, A.
- Text
- Washington, D.C. : National Aeronautics and Space Administration, [1986]
- 1986
Castle Wafer : or, the plain gold ring.
- Text
- New York : Dick & Fitzgerald, Publishers, [1868]
- 1868
- 1 Item
Item details Format Call Number Item Location Text NCW (Wood, E. P. Castle Wafer) Schwarzman Building M2 - General Research Room 315 Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.
Semiconductor wafer bonding : science and technology / Q.-Y. Tong, U. Gosele.
- Text
- New York ; Chichester [England] : John Wiley, c1999.
- 1999
- 1 Item
Item details Format Call Number Item Location Text JSE 99-176 Offsite Wafer fabrication : factory performance and analysis / Linda F. Atherton, Robert W. Atherton.
- Text
- Boston : Kluwer Academic Publishers, c1995.
- 1995
- 1 Item
Item details Format Call Number Item Location Text JSE 96-825 Offsite Wafer level antenna design at 20 GHz / by Theodore K. Anthony.
- Text
- Adelphi, Md. : Army Research Laboratory, [2008]
- 2008
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/LPS113047Integration of nanostructures into microsensor devices on whole wafers / Azlin M. Biaggi-Labiosa [and three others].
- Text
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, June 2015.
- 2015-6
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo66956A wafer chuck for use between -196 and 350C̊ / R. Y. Koyama and M. G. Beuhler, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
- Text
- Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
- 1979
- 1 Item
Item details Format Call Number Item Location Text C 13.10:400-55 Off-site Wafer-level integrated systems : implementation issues / Stuart K. Tewksbury.
- Text
- Boston : Kluwer Academic, c1989.
- 1989
- 1 Item
Item details Format Call Number Item Location Text JSE 89-553 Offsite Silicon wafer bonding technology : for VLSI and MEMS applications / edited by Subramanian S. Iyer and Andre J. Auberton-Hervé.
- Text
- London : Institution of Electrical Engineers, c2002.
- 2002
- 1 Item
Item details Format Call Number Item Location Text JSF 02-591 Offsite Workshop on temperature measurement of semiconductor wafers using thermocouples [microform] / K.G. Kreider ... [et al., editors].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
- 2001
Jeremy Wafer : artist's book / Lola Frost.
- Text
- Johannesburg : David Krut Pub., 2001.
- 2001
- 1 Item
Item details Format Call Number Item Location Text N7396.W26 F76 2001 Off-site Wafer-level integrated systems : implementation issues / Stuart K. Tewksbury.
- Text
- Boston : Kluwer Academic, [1989], ©1989.
- 1989-1989
- 1 Item
Item details Format Call Number Item Location Text TK7874 .T455 1989 Off-site Hermetic encapsulation of nanoenergetic porous silicon wafer by parylene / Eugene Zakar [and five others].
- Text
- Adelphi, MD : Army Research Laboratory, August 2014.
- 2014-8
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo61230Wafer scale integration, III : proceedings of the Third IFIP WG 10.5 Workshop on Wafer Scale Integration, Como, Italy, 6-8 June 1989 / edited by Mariagiovanna Sami, Fausto Distante.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
- 1990
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I329 1989 Off-site Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 / edited by Gabrièle Saucier, Jacques Trilhe.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I329 1986 Off-site Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 / edited by Gabrièle Saucier, Jacques Trilhe.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
- 1986
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I329 1986 Off-site Wafer scale ingtegration, II : proceedings of the Second IFIP WG 10.5 Workshop on Wafer Scale Integration, Egham, England, 23-25 September 1987 / edited by R.M. Lea.
- Text
- Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
- 1988
- 1 Item
Item details Format Call Number Item Location Text TK7874 .I329 1987 Off-site Metallization of large silicon wafers : final report / prepared by Robert A. Pryor.
- Text
- [Washington, D.C.] : U.S. Dept. of Energy, [Division of] Solar Energy ; Springfield, Va. : available from NTIS, [1979]
- 1979
- 1 Item
Item details Format Call Number Item Location Text TK2960 .P76 no. 4 Off-site Proceedings of the First International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications / edited by Ulrich Gösele ... [and others ; sponsored by the] Electronics and Dielectric Science and Technology divisions.
- Text
- Pennington, NJ : Electrochemical Society, [1992], ©1992.
- 1992-1992
- 1 Item
Item details Format Call Number Item Location Text TK7871.85 .I5838 1991 Off-site Handbook of semiconductor wafer cleaning technology : science, technology, and applications / edited by Werner Kern.
- Text
- Park Ridge, N.J., U.S.A. : Noyes Publications, c1993.
- 1993
- 1 Item
Item details Format Call Number Item Location Text JSE 94-776 Offsite Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden, Stephen R. Slaughter, Walter M. Duncan, Aslan Baghdadi.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1988.
- 1988
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo104837Thermal and structural assessments of a ceramic wafer seal in hypersonic engines [microform] / Mike T. Tong and Bruce M. Steinetz.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
- 1991
Evaluation and ranking of candidate ceramic wafer engine seal materials [microform] / Bruce M. Steinetz.
- Text
- [Washington, DC] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
- 1991
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 [microform] / J.C. Marshall and R.L. Mattis.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1992]
- 1992
Evaluation of an innovative high temperature ceramic wafer seal for hypersonic engine applications / Bruce M. Steinetz.
- Text
- Washington, D.C. : NASA, February 1992.
- 1992-2
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo173693A Framework for standard modular simulation : application to semiconductor wafer fabrication / Heshan Li [and others].
- Text
- [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2005]
- 2005
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo95707Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden ... [et al.].
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1988]
- 1988
High temperature performance evaluation of a hypersonic engine ceramic wafer seal [microform] / Bruce M. Steinetz.
- Text
- [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
- 1991
National security assessment of the U.S. semiconductor wafer processing equipment industry [microform].
- Text
- [Washington, D.C.] : U.S. Dept. of Commerce, Bureau of Export Administration, Office of Strategic Industries and Economic Security, Strategic Analysis Division : [Supt. of Docs., U.S. G.P.O., distributor, 1991]
- 1991
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