Research Catalog

  • Wafer thin / by Elin Elgaard.

    • Text
    • Dunvegan, Ont., Canada : Cormorant Books, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text PR9199.3.E43 W333 1992Off-site
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  • Pressed wafer [microform] / John Wieners.

    • Text
    • Buffalo, N.Y. : Gallery Upstairs Press, c1967.
    • 1967
  • Wafer thin / by Elin Elgaard.

    • Text
    • Dunvegan, Ont., Canada : Cormorant Books, c1992.
    • 1992
    • 1 Item
    FormatCall NumberItem Location
    Text JFD 93-12669Schwarzman Building M2 - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.

  • Phonographic wafers ...

    • Text
    • Bath [Eng.] I. Pitman [186-?]
    • 186
    • 1 Item
    FormatCall NumberItem Location
    Text *IDF (Phonographic Institution, Bath, Eng. Phonographic wafers)Offsite
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  • Pressed wafer / John Wieners.

    • Text
    • Buffalo, N.Y. : Gallery Upstairs Press, c1967.
    • 1967
    • 1 Item
    FormatCall NumberItem Location
    Text JAX B-2835Schwarzman Building M2 - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.

  • Pressed wafer.

    • Text
    • Boston, MA : Pressed Wafer, 2000-
    • 2000-present
    • 13 Items
    FormatCall NumberItem Location
    Text JFL 01-522Schwarzman Building - Main Reading Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

    FormatCall NumberItem Location
    Text JFL 01-522 v. 1- 2 (2000-01)Offsite
    FormatCall NumberItem Location
    Text JFL 01-522Schwarzman Building - Main Reading Room 315
    Not available - Please for assistance.
  • Ṿaflim limon = Lemon wafers / Yehudah Gizbar.

    • Text
    • Rishon le-Tsiyon : Yediʻot aḥaronot : Sifre ḥemed, [2020]
    • 2020
    • 1 Item
    FormatCall NumberItem Location
    Text PJ5055.22.I98 V34 2020Off-site
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  • Ṿaflim limon = Lemon wafers / Yehudah Gizbar.

    • Text
    • Rishon le-Tsiyon : Yediʻot aḥaronot : Sifre ḥemed , [2020]
    • 2020
    • 1 Item
    FormatCall NumberItem Location
    Text PJ5055.22.I98 V34 2020Off-site
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  • Ṿafelim limon = Lemon wafers / Yehudah Gizbar.

    • Text
    • Rishon le-Tsiyon : Miśkal : Yediʻot aḥaronot : Sifre Ḥemed, [2020]
    • 2020
    • 1 Item
    FormatCall NumberItem Location
    Text PJ5055.22.I98 V34 2020Off-site
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  • Wafer scale integration / edited by Earl E. Swartzlander, Jr.

    • Text
    • Boston : Kluwer Academic Publishers, [1989], ©1989.
    • 1989-1989
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .W33 1989Off-site
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  • The manufacture of biscuits, cakes, and wafers, by J. Fritsch ... in collaboration with P. Grospierre ...adapted from the French by Charles M. Stern ...

    • Text
    • London, Sir I. Pitman & Sons, Ltd., 1932.
    • 1932
    • 1 Item
    FormatCall NumberItem Location
    Text VTI (Fritsch, J. Manufacture of biscuits, cakes, and wafers)Offsite
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  • Fifth generation wafer architecture / Malcolm J. Shute.

    • Text
    • New York, N.Y. : Prentice Hall, 1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 88-671Offsite
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  • Noise temperature measurements on wafer / James. Randa.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1997.
    • 1997
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo98704
  • Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).

    • Text
    • Berlin ; New York : Springer-Verlag, [2004], ©2004.
    • 2004-2004
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .W27 2004Off-site
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  • Fifth generation wafer architecture / Malcolm J. Shute.

    • Text
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text QA76.85.S58 1988Off-site
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  • The technology of wafers and waffles. II, Recipes, product development and know-how / edited by Karl F. Tiefenbacher.

    • Text
    • London, United Kingdom ; San Diego, CA : Academic Press, [2019]
    • 2019
    • 1 Item
    FormatCall NumberItem Location
    Text JFE 19-4367Schwarzman Building - Main Reading Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Noise temperature measurements on wafer [microform] / J. Randa.

    • Text
    • Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
    • 1997
  • Pressed wafer / John Wieners.

    • Text
    • Buffalo, N.Y. : Gallery Upstairs Press, [1967], ©1967.
    • 1967-1967
    • 1 Item
    FormatCall NumberItem Location
    Text PS3573.I35 P7Off-site
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  • Jeremy Wafer : artist's book / Lola Frost.

    • Text
    • Johannesburg, South Africa : David Krut Pub., 2001
    • 1 Item
    FormatCall NumberItem Location
    Text MEMZ (Wafer) 05-2486Schwarzman Building - Print Collection Room 308

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

  • Wafer bonding : applications and technology / M. Alexe, U. Gösele (eds.).

    • Text
    • Berlin ; New York : Springer-Verlag, c2004.
    • 2004
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 04-1202Offsite
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  • Semiconductor wafer bonding : science and technology / Q.-Y. Tong, U. Gösele.

    • Text
    • New York : John Wiley, [1999], ©1999.
    • 1999-1999
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .T66 1999Off-site
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  • Apparatus for edge etching of semiconductor wafers [microform] / Casajus, A.

    • Text
    • Washington, D.C. : National Aeronautics and Space Administration, [1986]
    • 1986
  • Castle Wafer : or, the plain gold ring.

    • Text
    • New York : Dick & Fitzgerald, Publishers, [1868]
    • 1868
    • 1 Item
    FormatCall NumberItem Location
    Text NCW (Wood, E. P. Castle Wafer)Schwarzman Building M2 - General Research Room 315

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building M2 to submit a request in person.

  • Semiconductor wafer bonding : science and technology / Q.-Y. Tong, U. Gosele.

    • Text
    • New York ; Chichester [England] : John Wiley, c1999.
    • 1999
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 99-176Offsite
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  • Wafer fabrication : factory performance and analysis / Linda F. Atherton, Robert W. Atherton.

    • Text
    • Boston : Kluwer Academic Publishers, c1995.
    • 1995
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 96-825Offsite
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  • Wafer level antenna design at 20 GHz / by Theodore K. Anthony.

    • Text
    • Adelphi, Md. : Army Research Laboratory, [2008]
    • 2008
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/LPS113047
  • Integration of nanostructures into microsensor devices on whole wafers / Azlin M. Biaggi-Labiosa [and three others].

    • Text
    • Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, June 2015.
    • 2015-6
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo66956
  • A wafer chuck for use between -196 and 350C̊ / R. Y. Koyama and M. G. Beuhler, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.

    • Text
    • Washington : Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979.
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text C 13.10:400-55Off-site
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  • Wafer-level integrated systems : implementation issues / Stuart K. Tewksbury.

    • Text
    • Boston : Kluwer Academic, c1989.
    • 1989
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 89-553Offsite
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  • Silicon wafer bonding technology : for VLSI and MEMS applications / edited by Subramanian S. Iyer and Andre J. Auberton-Hervé.

    • Text
    • London : Institution of Electrical Engineers, c2002.
    • 2002
    • 1 Item
    FormatCall NumberItem Location
    Text JSF 02-591Offsite
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  • Workshop on temperature measurement of semiconductor wafers using thermocouples [microform] / K.G. Kreider ... [et al., editors].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]
    • 2001
  • Jeremy Wafer : artist's book / Lola Frost.

    • Text
    • Johannesburg : David Krut Pub., 2001.
    • 2001
    • 1 Item
    FormatCall NumberItem Location
    Text N7396.W26 F76 2001Off-site
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  • Wafer-level integrated systems : implementation issues / Stuart K. Tewksbury.

    • Text
    • Boston : Kluwer Academic, [1989], ©1989.
    • 1989-1989
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .T455 1989Off-site
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  • Hermetic encapsulation of nanoenergetic porous silicon wafer by parylene / Eugene Zakar [and five others].

    • Text
    • Adelphi, MD : Army Research Laboratory, August 2014.
    • 2014-8
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo61230
  • Wafer scale integration, III : proceedings of the Third IFIP WG 10.5 Workshop on Wafer Scale Integration, Como, Italy, 6-8 June 1989 / edited by Mariagiovanna Sami, Fausto Distante.

    • Text
    • Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
    • 1990
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I329 1989Off-site
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  • Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 / edited by Gabrièle Saucier, Jacques Trilhe.

    • Text
    • Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I329 1986Off-site
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  • Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 / edited by Gabrièle Saucier, Jacques Trilhe.

    • Text
    • Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
    • 1986
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I329 1986Off-site
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  • Wafer scale ingtegration, II : proceedings of the Second IFIP WG 10.5 Workshop on Wafer Scale Integration, Egham, England, 23-25 September 1987 / edited by R.M. Lea.

    • Text
    • Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988.
    • 1988
    • 1 Item
    FormatCall NumberItem Location
    Text TK7874 .I329 1987Off-site
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  • Metallization of large silicon wafers : final report / prepared by Robert A. Pryor.

    • Text
    • [Washington, D.C.] : U.S. Dept. of Energy, [Division of] Solar Energy ; Springfield, Va. : available from NTIS, [1979]
    • 1979
    • 1 Item
    FormatCall NumberItem Location
    Text TK2960 .P76 no. 4Off-site
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  • Proceedings of the First International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications / edited by Ulrich Gösele ... [and others ; sponsored by the] Electronics and Dielectric Science and Technology divisions.

    • Text
    • Pennington, NJ : Electrochemical Society, [1992], ©1992.
    • 1992-1992
    • 1 Item
    FormatCall NumberItem Location
    Text TK7871.85 .I5838 1991Off-site
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  • Handbook of semiconductor wafer cleaning technology : science, technology, and applications / edited by Werner Kern.

    • Text
    • Park Ridge, N.J., U.S.A. : Noyes Publications, c1993.
    • 1993
    • 1 Item
    FormatCall NumberItem Location
    Text JSE 94-776Offsite
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  • Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden, Stephen R. Slaughter, Walter M. Duncan, Aslan Baghdadi.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1988.
    • 1988
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo104837
  • Thermal and structural assessments of a ceramic wafer seal in hypersonic engines [microform] / Mike T. Tong and Bruce M. Steinetz.

    • Text
    • [Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
    • 1991
  • Evaluation and ranking of candidate ceramic wafer engine seal materials [microform] / Bruce M. Steinetz.

    • Text
    • [Washington, DC] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
    • 1991
  • National security assessment of the U.S. semiconductor wafer processing equipment industry [microform].

    • Text
    • [Washington, D.C.] : U.S. Dept. of Commerce, Bureau of Export Administration, Office of Strategic Industries and Economic Security, Strategic Analysis Division : [Supt. of Docs., U.S. G.P.O., distributor, 1991]
    • 1991
  • Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 [microform] / J.C. Marshall and R.L. Mattis.

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1992]
    • 1992
  • Evaluation of an innovative high temperature ceramic wafer seal for hypersonic engine applications / Bruce M. Steinetz.

    • Text
    • Washington, D.C. : NASA, February 1992.
    • 1992-2
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo173693
  • A Framework for standard modular simulation : application to semiconductor wafer fabrication / Heshan Li [and others].

    • Text
    • [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2005]
    • 2005
    • 1 Resource

    Available Online

    https://purl.fdlp.gov/GPO/gpo95707
  • Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden ... [et al.].

    • Text
    • Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1988]
    • 1988
  • The Life and wanderings of a [picture of a mouse sitting in a box of wafers] : Illustrated by W. Croome.

    • Text
    • Philadelphia : George S. Appleton, 148 Chestnut Street, 1849.
    • 1849
    • 1 Item
    FormatCall NumberItem Location
    Text *KH 1849 Life 14-56Schwarzman Building - Rare Book Collection Room 328

    Available - Can be used on site. Please visit New York Public Library - Schwarzman Building to submit a request in person.

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